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A study on the nucleation, growth and shrinkage of oxidation induced stacking faults(OSF), part I: nucleation and thermal behavior of oxidation induced stacking faults.

Authors

김용태; 김춘근; 민석기

Issue Date

1988-01

Citation

J. Kor. inst. telem. elec., v.v. 25, pp.759 - 765

URI

https://pubs.kist.re.kr/handle/201004/147599

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KIST Article > Others

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