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dc.contributor.author김상우-
dc.contributor.author신용욱-
dc.contributor.author배동식-
dc.contributor.author이종호-
dc.contributor.author김주선-
dc.contributor.author이해원-
dc.date.accessioned2015-12-02T05:14:55Z-
dc.date.available2015-12-02T05:14:55Z-
dc.date.issued200308-
dc.identifier.citationv. 437, 242-247.-
dc.identifier.issn0040-6090-
dc.identifier.other18207-
dc.identifier.urihttp://pubs.kist.re.kr/handle/201004/14908-
dc.publisherThin Solid Films-
dc.subjectsilicon oxide-
dc.titleThe effect of the amorphous insulator layer on conduction behaviors of the silica/indium tin oxide two-layer films.-
dc.typeArticle-
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