A novel technique for the measurement of Ge adatom surface migration length on Si(001)

Title
A novel technique for the measurement of Ge adatom surface migration length on Si(001)
Authors
H.J.Kim장준연Y.H.Xie
Issue Date
2002-04
Publisher
2002 MRS Spring Meeting
URI
http://pubs.kist.re.kr/handle/201004/15783
Appears in Collections:
KIST Publication > Conference Paper
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