Interface study of ion irradiated Cu/Ni/Cu(001)/Si thin film by x-ray reflectivity

Title
Interface study of ion irradiated Cu/Ni/Cu(001)/Si thin film by x-ray reflectivity
Authors
김태곤송종한이택휘채근화황현미전기영이재용정광호황정남이준식이기붕
Keywords
수직자기이방성; 이온조사; Ni/Cu; X-선 반사도; 혼합열
Issue Date
2002-10
Publisher
한국자기학회지; Journal of the Korean Magnetics Socie
Citation
VOL 12, NO 5, 184-188
URI
http://pubs.kist.re.kr/handle/201004/16109
ISSN
15985385
Appears in Collections:
KIST Publication > Article
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