Ferroelectric domain structure of epitaxial (Pb,Sr)TiO₃ thin films
- Ferroelectric domain structure of epitaxial (Pb,Sr)TiO₃ thin films
- Yong Kwan Kim; 이경석; 백성기
- domain formation
- Issue Date
- Journal of materials research
- VOL 16, NO 9, 2463-2466
- Epitaxial (Pb1−xSrx)TiO3 (PST, x 4 0.0–0.24) thin films were grown on MgO(001)
single-crystal substrates by pulsed laser deposition. General x-ray diffraction
techniques including u–2u scan and rocking curve were used to determine lattice
constants, degree of c-axis orientation, and crystal quality of the tetragonal thin films.
The degree of c-axis orientation in the epitaxial PST films increased as Sr
concentration (x) increased, which in turn induces the systematic change in the Curie
temperature as well as the transformation strain at and below the Curie temperature.
An inverse relation between the c-domain abundances and the transformation strains is
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