PEEM and NEXAFS analysis of wear debris of Si incorporated dianomd like carbon films in various envrionments

Title
PEEM and NEXAFS analysis of wear debris of Si incorporated dianomd like carbon films in various envrionments
Authors
박세준은광용이광렬Andreas SchollFrithjof NoltingH. Padmore
Keywords
pnotoemission electron microscopic analysis
Issue Date
2001-07
Publisher
Proceedings of the Sixth Applied Diamond Conference/Second Frontier Carbon Technology Joint Conferen
Citation
, 454-454
URI
http://pubs.kist.re.kr/handle/201004/16316
Appears in Collections:
KIST Publication > Conference Paper
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