Electromigration-induced failure in near-bamboo interconnects

Title
Electromigration-induced failure in near-bamboo interconnects
Authors
박영준
Keywords
electromigration
Issue Date
2001-06
Publisher
대한금속 . 재료학회지; Journal of the Korean Institute of Metals and Materials
Citation
VOL 39, NO 6, 707-711
URI
http://pubs.kist.re.kr/handle/201004/16378
ISSN
1738-8228
Appears in Collections:
KIST Publication > Article
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