Correlation between charge injection and memory window in the ferroelectric gate stack structures

Title
Correlation between charge injection and memory window in the ferroelectric gate stack structures
Authors
이성균최인훈이철의김용태김춘근
Keywords
ferroelectric gate structure
Issue Date
2001-06
Publisher
2001 Korea-japan Joint Workshop on Advanced Semiconductor Process and Equipment
Citation
, 13-15
URI
http://pubs.kist.re.kr/handle/201004/16384
Appears in Collections:
KIST Publication > Conference Paper
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