Characterization of domain structures in epitaxial PZT thin films using synchrotron XRD

Title
Characterization of domain structures in epitaxial PZT thin films using synchrotron XRD
Authors
이경석백성기
Keywords
microstructure characterization; synchrotron x-ray diffraction; epitaxial PZT thin films
Issue Date
2000-03
Publisher
The 12th International Symposium on Integrated Ferroelectrics
URI
http://pubs.kist.re.kr/handle/201004/17373
Appears in Collections:
KIST Publication > Conference Paper
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