Effects of ion implantation on the electrical properties of Au/n-Si Schottky diodes

Title
Effects of ion implantation on the electrical properties of Au/n-Si Schottky diodes
Authors
M.H. JooK.H. Lee송종한S. Im
Keywords
schottky doiode; defects; edge termination; I-V; C-V
Issue Date
2000-01
Publisher
Materials science & engineering B, Solid-state materials for advanced technology
Citation
VOL 71, 224-228
URI
http://pubs.kist.re.kr/handle/201004/17711
ISSN
0921-5107
Appears in Collections:
KIST Publication > Article
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