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Issue DateTitleAuthor(s)
199201Charge trapping instabilities in SiO2/InP MIS structures.강광남; 이정일; 최병두; 김충환; 임한조; 한일기
199101Heating effect in plasma-enhanced chemical vapor deposition of silicon-nitride.강광남; 이정일; J. H. Jo; 한일기; Y. J. Lee
199101Active and passive element modeling for MMIC, talking process conditions into account.강광남; 이정일; 한일기; 이유종; 김성일; S. H. Hong
199101A study on the parasitic resistance of a short channel MOSFETs with lightly doped drain structure.강광남; 이정일; 이명복; 윤경식
199101Simple model for gate-voltage dependent parasitic resistance in short channel lightly doped drain metal oxide semiconductor field effect transistors.강광남; 이정일; 이명복; S. Y. Lee; 윤경식
199101Spectroscopic ellipsometry measurements on the silicon nitride films formed by PECVD in InP.강광남; 이정일; 한일기; 김상열
199201Effects of carrier-velocity saturation on the characteristics of short channel MOSFETs with lightly doped drains.강광남; 이정일; M. B. Lee; K. S. Yoon; S. Hong
199201A simple model for second substrate current hump in LDD MOSFETs.강광남; 이정일; M. B. Lee; K. S. Yoon; S. Hong
199201Electrical subbands in a both-side-modulation-doped In//0//.//5//2Al//0//.//4//8As/In//0//.//6//5Ga//0//.//3//5As single quantum well.강광남; 이정일; T. W. Kim; K. S. Lee; K. H. Yoo; G. Ih
199201PECVD 방법에 의해 제작된 SiNx/InP MIS 구조의 bias stress 에 의한 C-V 및 G-V 곡선의 변화 .강광남; 이정일; 이명복; 한일기; 이유종

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