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Issue DateTitleAuthor(s)
199906Formation and growth of elliptical grains in the crystallization of the amorphous SrBi2Ta2O9 thin films최재형; 이정용; 김용태
200106The effect of ZrO2 buffer layer on electrical properties in Pt/SrBi2Ta2O9/ZrO2 Si ferroelectric gate oxide structure최훈상; 김은홍; 최인훈; 김용태; 최재형; 이정용
200107Crystal structure and electrical properties Pt/SrBi2Ta2O9/ZrO2/Si최훈상; 김은홍; 최인훈; 김용태; 최재형; 이정용
200308Two-layer crystallization of amorphous YMnO₃ thin films on Si (100) substrates유동철; 이정용; 김익수; 김용태
200201Crystallization behavior of ferroelectric YMnO ₃ thin films on Si(100) substrates유동철; 이정용; 김익수; 김용태
200301Microstructure control of YMnO₃ thin films on Si (100) substrates유동철; 이정용; 김익수; 김용태
200111Effects of post-annealing on the microstructure and ferroelectric properties of YMnO ₃ thin films on Si유동철; 이정용; 김익수; 김용태
199905Elliptical grain growth in the solid-phase crystallization of amorphous SrBi2Ta2O9 thin films최재형; 이정용; 김용태
199401TEM studies of plasma deposited tungsten and tungsten nitride barriers for thermally stable metallization.김용태; 이창우; 민석기; 이주천; 이정용; 박영욱
199401New method to improve thermal stability in the interface of silicon and tungsten by the interposition of plasma deposited tungsten nitride thin film.김용태; 이창우; 이정용

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