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Issue DateTitleAuthor(s)
199101A study on the parasitic resistance of a short channel MOSFETs with lightly doped drain structure.강광남; 이정일; 이명복; 윤경식
199101Simple model for gate-voltage dependent parasitic resistance in short channel lightly doped drain metal oxide semiconductor field effect transistors.강광남; 이정일; 이명복; S. Y. Lee; 윤경식
199201PECVD 방법에 의해 제작된 SiNx/InP MIS 구조의 bias stress 에 의한 C-V 및 G-V 곡선의 변화 .강광남; 이정일; 이명복; 한일기; 이유종
199001Reduction of transconductance in saturation region of short channel LDD NMOSFETs.강광남; 이명복; 이정일
199011A study on silicon/silicon dioxide interface by C-V techniques.강광남; 이정일; 이명복; 주병권; 김형곤; 오명환
199301Fabrication and characterization of silicon device for flow measurement (I)강광남; 이정일; 오명환; 김형곤; 주병권; 이명복
199001Simple extraction method for mobility parameters in Si-MOSFETs at 77K.강광남; 이정일; 이명복; K. O. Park
199101A study on the instability in PECVD-SiNx/InP structure utilizing capacatance and conductnace techniques.강광남; 이정일; 한일기; 이명복
199101A study on the interface states and capacitance-voltage behavior of InP MIS diode fabricated by plasma assisted oxidation.강광남; 이정일; 이명복; 임한조; J. A. Baglio; N. Decola
199001A simple model for parasitic resistances of LDD MOSFETS.강광남; 이정일; 이명복; 윤경식

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