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Issue DateTitleAuthor(s)
200604Medium Range Order in amorphous Ge2Sb2Te5 measured by fluctuation electron microscopy권민호; 이봉섭; Stephanie N. Bogle; John R. Abelson; Stephen G. Bishop; Simone Raoux; Heng Li; P. Craig Taylor
200604Thermal conductivity of phase change material Ge2Sb2Te5여호기; David G. Cahill; 권민호; 이봉섭; John R. Abelson; Stephen G. Bishop; 김기범; 정병기
200612A transmission electron microscopy study on the atomic arrangement and grain growth of hexagonal structured Ge2Sb2Te5박유진; 이정용; 김용태
200607In situ transmission electron microscopy study on the nucleation and grain growth of Ge2Sb2Te5 thin films김용태; 박유진; 이정용; 김성일; 김영환; 아키히로 와카하라
200605An experimental investigation on the origin of super-resolution effects of Te-based chalcogenide semiconducting thin films이현석; 이택성; 정증현; 강대환; 김원목; 김동환; 정병기
200609In situ transmission electron microscopy study of the nucleation and grain growth of Ge2Sb2Te5 thin films박유진; 이정용; 김용태
200605Surface energy and the equilibrium shape of hexagonal structured Ge2Sb2Te5 grain박유진; 이정용; 김용태
200604Photo-oxidation and the absence of photodarkening in Ge2Sb2Te5 phase change materialBong-Sub Lee; Ying Xiao; Stephen G. Bishop; John R. Abelson; Simone Raoux; Vaughn R. Deline; Min-Ho Kwon; Ki-Bum Kim; 정병기; Heng Li; P. Craig Taylor
200612Patterning of Ge2Sb2Te5 phase change material using UV nano-imprint lithography양기연; 홍성훈; 김덕기; 정병기; 이헌
200610Thermal conductivity of phase-change material Ge2Sb2Te5여호기; David G. Cahill; 이봉섭; J. R. Abelson; 권민호; 김기범; Stephen G. Bishop; 정병기

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