Microstructural characterization of epitaxial PbTiO ₃ thin films usig synchrotron X-ray diffraction

Title
Microstructural characterization of epitaxial PbTiO ₃ thin films usig synchrotron X-ray diffraction
Authors
이경석백성기
Keywords
domain structure; synchrotron X-ray diffraction; epitaxial PZT thin film
Issue Date
1999-03
Publisher
11th International Symposium on Integrated Ferroelectrics, Colorado, USA, March 7-10, 1999.
Citation
, ?-?
URI
http://pubs.kist.re.kr/handle/201004/18106
Appears in Collections:
KIST Publication > Conference Paper
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