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dc.contributor.author최용삼-
dc.contributor.author장재호-
dc.contributor.author김대승-
dc.contributor.author김긍호-
dc.contributor.author백홍구-
dc.date.accessioned2015-12-02T05:39:30Z-
dc.date.available2015-12-02T05:39:30Z-
dc.date.issued199901-
dc.identifier.citationVOL 34, NO 9, 1473-1479-
dc.identifier.issn0025-5408-
dc.identifier.other10043-
dc.identifier.urihttp://pubs.kist.re.kr/handle/201004/18491-
dc.publisherMaterials research bulletin-
dc.subjectoxides-
dc.subjectthin films-
dc.subjectX-ray diffraction-
dc.subjectphase transitions-
dc.titlePhase transformation and morphological evolution of ion-beam sputtered tin oxide films on silicon substrate-
dc.typeArticle-
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