Low frequency noise measurements on TiN/n-Si Schottky diodes

Title
Low frequency noise measurements on TiN/n-Si Schottky diodes
Authors
이정일J. BriniG. KamarinosC. A. DimitriadisS. LogothetidisP. Patsalas
Keywords
Schottky barriers
Issue Date
1999-01
Publisher
Applied surface science
Citation
VOL 142, 390-393
URI
http://pubs.kist.re.kr/handle/201004/18518
ISSN
0169-4332
Appears in Collections:
KIST Publication > Article
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