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dc.contributor.author이정일-
dc.contributor.authorJ. Brini-
dc.contributor.authorG. Kamarinos-
dc.contributor.authorC. A. Dimitriadis-
dc.contributor.authorS. Logothetidis-
dc.contributor.authorP. Patsalas-
dc.date.accessioned2015-12-02T05:39:41Z-
dc.date.available2015-12-02T05:39:41Z-
dc.date.issued199901-
dc.identifier.citationVOL 142, 390-393-
dc.identifier.issn0169-4332-
dc.identifier.other9994-
dc.identifier.urihttp://pubs.kist.re.kr/handle/201004/18518-
dc.publisherApplied surface science-
dc.subjectSchottky barriers-
dc.titleLow frequency noise measurements on TiN/n-Si Schottky diodes-
dc.typeArticle-
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