In-situ analysis on domain evolution of epitaxial PLT, PZT thin films using synchrotron XRD

Title
In-situ analysis on domain evolution of epitaxial PLT, PZT thin films using synchrotron XRD
Authors
이경석강영민백성기
Keywords
domain evolution; ferroelectric thin film; synchrotron X-ray diffraction
Issue Date
1997-08
Publisher
The 9th International Meeting on Ferroelectricity, Seoul, Korea, August 24-29, 1997.
Citation
, ?-?
URI
http://pubs.kist.re.kr/handle/201004/19391
Appears in Collections:
KIST Publication > Conference Paper
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