Atomic force microscopy study of GaN-buffer layers on SiC(0001) by MOCVD

Title
Atomic force microscopy study of GaN-buffer layers on SiC(0001) by MOCVD
Authors
임동섭변동진김긍호남옥현최인훈박달근금동화
Keywords
GaN
Issue Date
1996-11
Publisher
Materials research society symposium proceedings,
Citation
v. 423, 451-456
URI
http://pubs.kist.re.kr/handle/201004/20198
Appears in Collections:
KIST Publication > Conference Paper
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE