Strain and critical layer thickness analysis of carbon-doped GaAs.

Title
Strain and critical layer thickness analysis of carbon-doped GaAs.
Authors
김성일민석기김무성
Keywords
MOCVD
Issue Date
1996-01
Publisher
Solid state communications
Citation
v. 97, no. 10, 875-878
URI
http://pubs.kist.re.kr/handle/201004/20310
Appears in Collections:
KIST Publication > Article
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