DC biased capacitance method for measuring thin film magnetostriction and ΔEeffect

Title
DC biased capacitance method for measuring thin film magnetostriction and ΔEeffect
Authors
이영호Y.D. ShinP.H. HerrK.H. Lee김희중한석희강일구J.R. Rhee
Keywords
thin film
Issue Date
1994-11
Publisher
IEEE Transactions on Magnetics
Citation
VOL 30, NO 6, 4566-4568
URI
http://pubs.kist.re.kr/handle/201004/21076
ISSN
0018-9464
Appears in Collections:
KIST Publication > Article
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