Constant capacitance technique to study electrical instabilities in InP MIS provided by PECVD silicon nitride.

Title
Constant capacitance technique to study electrical instabilities in InP MIS provided by PECVD silicon nitride.
Authors
강광남이정일한일기C. H. KimB. ChoeH. L. ParkH. Lim
Keywords
InP MIS
Issue Date
1993-01
Publisher
Appl. surf. sci.
Citation
v. 65/66, 858-862
URI
http://pubs.kist.re.kr/handle/201004/21461
Appears in Collections:
KIST Publication > Article
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE