Characterization of a MOCVD grown GaAs/AlGaAs superlattice using spectroscopic ellipsometry.

Title
Characterization of a MOCVD grown GaAs/AlGaAs superlattice using spectroscopic ellipsometry.
Authors
김용김무성김상열엄경숙민석기
Keywords
spectroscopic ellipsometry; superlattice; MOCVD
Issue Date
1991-01
Publisher
Journal of Korean physical society
Citation
v. 24, 359-?
URI
http://pubs.kist.re.kr/handle/201004/21862
Appears in Collections:
KIST Publication > Article
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