X-ray and DLTS characterization of In//xGa//1//-//xAs/GaAs layers grown by VPE using an In/Ga alloy source.

Title
X-ray and DLTS characterization of In//xGa//1//-//xAs/GaAs layers grown by VPE using an In/Ga alloy source.
Authors
김은규김현수민석기이주천
Keywords
X-ray; DLTS; InGaAs/GaAs layer; VPE
Issue Date
1989-10
Publisher
Applied physics A
Citation
v. 49, 143-147
URI
http://pubs.kist.re.kr/handle/201004/22116
Appears in Collections:
KIST Publication > Article
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