Structural characterization of ferroelectric domain formation in epitaxial PZT thin films by two-dimensional reciprocal space mapping using synchrotron x-ray diffraction

Title
Structural characterization of ferroelectric domain formation in epitaxial PZT thin films by two-dimensional reciprocal space mapping using synchrotron x-ray diffraction
Authors
이경석백성기
Keywords
domain formation; synchrotron x-ray diffraction; epitaxial PZT thin film; reciprocal space mapping
Issue Date
2000-02
Publisher
Proceedings of the 12th Synchrotron Radiation User Workshop
Citation
, 199-201
URI
http://pubs.kist.re.kr/handle/201004/22848
Appears in Collections:
KIST Publication > Conference Paper
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