Optical study of InAs quantum dots and wetting layer using spectroscopic ellipsometry

Title
Optical study of InAs quantum dots and wetting layer using spectroscopic ellipsometry
Authors
이호선박용주김은규
Keywords
ellipsometry; InAs quantum dots; wetting layer
Issue Date
2001-12
Publisher
The 8th Kor. Conf. on Semicon.
Citation
, 731-732
URI
http://pubs.kist.re.kr/handle/201004/22945
Appears in Collections:
KIST Publication > Conference Paper
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE