Suppression of interface migration and improvement of dielectric properties in SrTiO ₃ -based materials

Title
Suppression of interface migration and improvement of dielectric properties in SrTiO ₃ -based materials
Authors
김주선구상윤강석중
Keywords
diffusion induced grain-boundary migration (DIGM)
Issue Date
2002-01
Publisher
Key engineering materials
Citation
VOL 214-215, 61-66
URI
http://pubs.kist.re.kr/handle/201004/23555
ISSN
1013-9826
Appears in Collections:
KIST Publication > Article
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