고분자 표면분석을 위한 비행시간형 이차이온 질량분석(TOF-SIMS) 기술

Title
고분자 표면분석을 위한 비행시간형 이차이온 질량분석(TOF-SIMS) 기술
Authors
이연희
Keywords
TOF-SIMS; polymer; surface
Issue Date
2000-12
Publisher
고분자 과학과 기술; Polymer science and technology
Citation
VOL 11, NO 6, 798-805
URI
http://pubs.kist.re.kr/handle/201004/23864
ISSN
1225-0260
Appears in Collections:
KIST Publication > Article
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