Structural characterization of epitaxial PLZT thin films

Title
Structural characterization of epitaxial PLZT thin films
Authors
이경석백성기
Keywords
domain structure; PZT; strain relaxation; x-ray diffraction
Issue Date
1998-08
Publisher
Proceedings of the 3rd DIM-CISEM Joint Seminar, Tokyo, Japan, August 6-7, 1998.
Citation
, 1-9
URI
http://pubs.kist.re.kr/handle/201004/24150
Appears in Collections:
KIST Publication > Conference Paper
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE