Surface analysis by time-of-flight secondary ion mass spectrometry(TOF-SIMS)

Title
Surface analysis by time-of-flight secondary ion mass spectrometry(TOF-SIMS)
Authors
이연희한승희
Keywords
TOF-SIMS; Surface analysis; Polymer; Depth profile; Imaging
Issue Date
1997-10
Publisher
Analytical science and technology
Citation
VOL 10, NO 5, 87A-104A
URI
http://pubs.kist.re.kr/handle/201004/24389
Appears in Collections:
KIST Publication > Article
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