Sub-bandgap photonic characterization of the gate leakage in pseudomorphic high-electron mobility transistors

Title
Sub-bandgap photonic characterization of the gate leakage in pseudomorphic high-electron mobility transistors
Authors
김동명이정일김회종
Keywords
Photo-response; Gate leakage; High-electron mobility transistors
Issue Date
2003-10
Publisher
The First International Symposium on Future Issues in Nano-optoelectronics
Citation
, 40-41
URI
http://pubs.kist.re.kr/handle/201004/25250
Appears in Collections:
KIST Publication > Conference Paper
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