Full Integration and Cell Characteristics for 64Mb Nonvolatile PRAM

Title
Full Integration and Cell Characteristics for 64Mb Nonvolatile PRAM
Authors
S.H. LeeY.N. HwangS.Y. LeeK.C. RyooS.J. Ahn구현철C.W. JeongY.-T. KimG.H. KohG.T. JeongH.S. JeongKinam Kim
Keywords
full integration; 64Mb; PRAM; high density; cell characteristics
Issue Date
2004-06
Publisher
2004 Symposium on VLSI Technology-Digest of Technical Papers
Citation
, 20-21
URI
http://pubs.kist.re.kr/handle/201004/25755
Appears in Collections:
KIST Publication > Conference Paper
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