Time-of-Flight Secondary Ion Mass Spectrometry for Surface Analysis

Title
Time-of-Flight Secondary Ion Mass Spectrometry for Surface Analysis
Authors
이연희
Keywords
TOF-SIMS; surface analysis; ion gun
Issue Date
2003-12
Publisher
화학세계
Citation
VOL 12, 24-29
URI
http://pubs.kist.re.kr/handle/201004/26520
Appears in Collections:
KIST Publication > Article
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