Optimum condition and characterization of antireflection(AR) coating with ultralow reflectivity for semiconductor optical devices

Title
Optimum condition and characterization of antireflection(AR) coating with ultralow reflectivity for semiconductor optical devices
Authors
전행림최재원변영태전영민김선호송석호
Issue Date
2004-11
Publisher
PC04 Photonics Confernece 2004
URI
http://pubs.kist.re.kr/handle/201004/26620
Appears in Collections:
KIST Publication > Conference Paper
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