Low-frequency noise parameter extraction in poly-Si thin-film transistors

Title
Low-frequency noise parameter extraction in poly-Si thin-film transistors
Authors
남형도양해석이정일A. ChovetB. Szentpali김은규
Keywords
low frequency noise; Poly-Si thin-film transistor; parameter extraction; polycrystalline silicon thin film transistor; number fluctuation; thermal activation; tunneling; grain boundary barrier height
Issue Date
2005-05
Publisher
Third SPIE International Symposium on Fluctuations and Noise, 24-26 May 2005, Austin Marriott at the Capital, Austin, Texas USA
Citation
VOL 5844, 200-207
URI
http://pubs.kist.re.kr/handle/201004/28224
Appears in Collections:
KIST Publication > Conference Paper
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