A New Method for Lateral Force Calibration in Atomic Force Microscope

Title
A New Method for Lateral Force Calibration in Atomic Force Microscope
Authors
김홍준왕비윤의성공호성
Keywords
Atomic Force Microscopy; Lateral Force; Calibration; Contact factor
Issue Date
2005-10
Publisher
한국윤활학회지; Journal of the KSTLE (Journal of the Korean Society of Tribologists and Lubrication Engineers)
Citation
VOL 21, NO 5, 216-222
URI
http://pubs.kist.re.kr/handle/201004/28333
ISSN
1229-4845
Appears in Collections:
KIST Publication > Article
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