Fast-Fourier Transform method to identify the high resolution transmission electron microscopy images of GST thin films

Title
Fast-Fourier Transform method to identify the high resolution transmission electron microscopy images of GST thin films
Authors
김용태박유진이정용
Keywords
GST; TEM
Issue Date
2005-10
Publisher
2005 Korea-Japan joint workshop on advanced semiconductor processes and equipments
URI
http://pubs.kist.re.kr/handle/201004/28362
Appears in Collections:
KIST Publication > Conference Paper
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