Characterization of sputter-deposited SrZrO3:Cr films on Si substrates for commercial memory device applications

Title
Characterization of sputter-deposited SrZrO3:Cr films on Si substrates for commercial memory device applications
Authors
박재완박종완이전국
Keywords
resistive switching; SrZrO3:Cr; polycrystalline; Silicon substrate
Issue Date
2006-12
Publisher
Journal of the Korean Physical Society
Citation
VOL 49, S447-S451
URI
http://pubs.kist.re.kr/handle/201004/29487
ISSN
0374-4884
Appears in Collections:
KIST Publication > Article
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE