Effect of Thermal Stress on the Microwave Dielectric Properties of (300-x) nm MgTiO3/(x) nm CaTiO3 Thin Films

Title
Effect of Thermal Stress on the Microwave Dielectric Properties of (300-x) nm MgTiO3/(x) nm CaTiO3 Thin Films
Authors
윤기현최지원
Keywords
Thermal stress; Microwave dielectrics; Dielectric loss; Dielectric layer
Issue Date
2006-10
Publisher
Advances in Science and Technology
Citation
VOL 45, 2332-2336
URI
http://pubs.kist.re.kr/handle/201004/29709
ISSN
1661819X
Appears in Collections:
KIST Publication > Article
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