Medium Range Order in amorphous Ge2Sb2Te5 measured by fluctuation electron microscopy

Title
Medium Range Order in amorphous Ge2Sb2Te5 measured by fluctuation electron microscopy
Authors
권민호이봉섭Stephanie N. BogleJohn R. AbelsonStephen G. BishopSimone RaouxHeng LiP. Craig Taylor
Keywords
Ge2Sb2Te5; medium range order; fluctuation electron microscopy
Issue Date
2006-04
Publisher
MRS 2006 spring meeting
URI
http://pubs.kist.re.kr/handle/201004/30163
Appears in Collections:
KIST Publication > Conference Paper
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