Thickness dependence of exchange anisotropy in NiFe/IrMn bilayers studied by Planar Hall Effect

Title
Thickness dependence of exchange anisotropy in NiFe/IrMn bilayers studied by Planar Hall Effect
Authors
N.T. Thanh전명길N.D. Ha김광윤C.O. KimC.G. Kim
Keywords
Planar Hall Effect; AMR; Exchange biased-coupling
Issue Date
2006-10
Publisher
Journal of magnetism and magnetic materials
Citation
VOL 305, NO 2, 432-435
URI
http://pubs.kist.re.kr/handle/201004/30878
ISSN
0304-8853
Appears in Collections:
KIST Publication > Article
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE