Nanometer-scale Order in Amorphous Ge2Sb2Te5 Analyzed by Fluctuation Electron Microscopy

Title
Nanometer-scale Order in Amorphous Ge2Sb2Te5 Analyzed by Fluctuation Electron Microscopy
Authors
권민호이봉섭Stephanie N. BogleLakshmi N. NittalaStephen G. BishopJohn R. AbelsonSimone Rauox정병기김기범
Keywords
Phase Change Memory material; Ge2Sb2Te5; Nanometer-scale order; fluctuation electron microscopy
Issue Date
2007-01
Publisher
Applied physics letters
Citation
VOL 90, 021923-1-021923-3
URI
http://pubs.kist.re.kr/handle/201004/31038
ISSN
0003-6951
Appears in Collections:
KIST Publication > Article
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