Plane-strain bulge test for nanocrystalline copper thin films

Title
Plane-strain bulge test for nanocrystalline copper thin films
Authors
X. Wei이동윤심상훈X. ChenJ.W. Kysar
Keywords
nanocrystalline materials; thin films; bulge test
Issue Date
2007-09
Publisher
Scripta materialia
Citation
VOL 57, NO 6, 541-544
URI
http://pubs.kist.re.kr/handle/201004/31553
ISSN
1359-6462
Appears in Collections:
KIST Publication > Article
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