Atomic arrangement variations of [0001]-tilt grain boundaries in ZnO thin films grown on p-Si substrates due to thermal treatment

Title
Atomic arrangement variations of [0001]-tilt grain boundaries in ZnO thin films grown on p-Si substrates due to thermal treatment
Authors
J.W. ShinJ.Y.Lee노영수J.H. Jung김태환최원국
Keywords
grain boundary; p-Si; ZnO; TEM
Issue Date
2007-07
Publisher
Applied physics letters
Citation
VOL 90, 181907-1-181907-3
URI
http://pubs.kist.re.kr/handle/201004/31647
ISSN
0003-6951
Appears in Collections:
KIST Publication > Article
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