Thickness dependence of parallel and perpendicular anisotropic resistivity in Ta/NiFe/IrMn/Ta multilayer studied by anisotropic magnetoresistance and planar Hall effect

Title
Thickness dependence of parallel and perpendicular anisotropic resistivity in Ta/NiFe/IrMn/Ta multilayer studied by anisotropic magnetoresistance and planar Hall effect
Authors
N. T. ThanhL. T. TuN. D. HaC. O. Kim김철기신경호B. Parvatheeswara Ra
Issue Date
2007-03
Publisher
Journal of applied physics
Citation
VOL 101, 053702-1-053702-5
URI
http://pubs.kist.re.kr/handle/201004/31886
ISSN
0021-8979
Appears in Collections:
KIST Publication > Article
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