Microstructural investigation of SexTe100-x thin films deposited on Si(100) substrates by x-ray diffractometer and transmission electron microscopy analysis

Title
Microstructural investigation of SexTe100-x thin films deposited on Si(100) substrates by x-ray diffractometer and transmission electron microscopy analysis
Authors
김은태이정용김용태
Keywords
transmission electron microscopy; Se?e solid solution; Se5.95Te1.05 monoclinic structure
Issue Date
2007-11
Publisher
Japanese Journal of Applied Physics, Part 1- Regular Papers
Citation
VOL 46, NO 11, 7392-7395
URI
http://pubs.kist.re.kr/handle/201004/32461
ISSN
0021-4922
Appears in Collections:
KIST Publication > Article
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE