Effect of Thermal Annealing on the Formation of Preferential c-Axis Orientation and an Interfacial Layer for ZnO Thin Films Grown on an n-Si (001) Substrate

Title
Effect of Thermal Annealing on the Formation of Preferential c-Axis Orientation and an Interfacial Layer for ZnO Thin Films Grown on an n-Si (001) Substrate
Authors
J. M. YukJ. W. ShinJ. Y. LeeD. I. SonJ. H. JungT. W. KimJ. Y. Kim최원국
Issue Date
2007-03
Publisher
Journal of the Korean Physical Society
Citation
VOL 50, NO 3, 608-611
URI
http://pubs.kist.re.kr/handle/201004/32662
ISSN
0374-4884
Appears in Collections:
KIST Publication > Article
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