Low-frequency noise characterization of ZnO nanorod back-gate field-effect transistor structure

Title
Low-frequency noise characterization of ZnO nanorod back-gate field-effect transistor structure
Authors
이정일유병용이철호이규철손승훈김규태Gerard Ghibaudo
Keywords
ZnO nanorod; Field-effect transistors; Low-frequency noise; Surface states
Issue Date
2008-04
Publisher
Physica E, Low-dimensional systems & nanostructures
Citation
VOL 40, NO 6, 2147-2149
URI
http://pubs.kist.re.kr/handle/201004/34144
ISSN
1386-9477
Appears in Collections:
KIST Publication > Article
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