Improving the Gate Stability of ZnO Thin-Film Transistors with aluminum oxide dielectric layers

Title
Improving the Gate Stability of ZnO Thin-Film Transistors with aluminum oxide dielectric layers
Authors
오민석이기문송종한Byoung H. LeeMyung M. SungD. K. Hwang임성일
Keywords
thin film transistor; gate; zno
Issue Date
2008-10
Publisher
Journal of the Electrochemical Society
Citation
VOL 155, NO 12, H1009-H1014
URI
http://pubs.kist.re.kr/handle/201004/34554
ISSN
0013-4651
Appears in Collections:
KIST Publication > Article
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